Index: TestSupport.h =================================================================== diff -u -r3a31c0f872075c76d978144b60255bb8c4baeb37 -r0e8c31075f9c562de5ec0e37bb8bf91531236f6d --- TestSupport.h (.../TestSupport.h) (revision 3a31c0f872075c76d978144b60255bb8c4baeb37) +++ TestSupport.h (.../TestSupport.h) (revision 0e8c31075f9c562de5ec0e37bb8bf91531236f6d) @@ -7,8 +7,8 @@ * * @file TestSupport.h * -* @author (last) Varshini Nagabooshanam -* @date (last) 19-Jan-2026 +* @author (last) “rkallala” +* @date (last) 27-Jan-2026 * * @author (original) Sean Nash * @date (original) 01-Aug-2024 @@ -50,12 +50,20 @@ /// DD test software configurations typedef enum test_Config_enums { - TEST_CONFIG_DISABLE_BC_PRESSURE_ALARMS = 0, ///< Test configuration disabling BC pressure alarms - TEST_CONFIG_FIRST = TEST_CONFIG_DISABLE_BC_PRESSURE_ALARMS, ///< Test configuration first configuration. - TEST_CONFIG_ENABLE_DRY_BICART_FILL, ///< Test configuration disabling Dry Bicart fill check - TEST_CONFIG_ENABLE_4WIRE_RINSE_PUMP, ///< Test configuration enable 4-wire rinse pump. - TEST_CONFIG_SKIP_FILTERS_FLUSH, ///< Test configuration to skip filter flush - NUM_OF_TEST_CONFIGS ///< Number of test configuration. + TEST_CONFIG_DD_FP_ENABLE_BETA_1_0_HW = 0, ///< Test configuration DD & FP enable Beta 1.0 hardware + TEST_CONFIG_FIRST = TEST_CONFIG_DD_FP_ENABLE_BETA_1_0_HW, ///< Test configuration first configuration. + TEST_CONFIG_DD_DISABLE_BC_PRESSURE_ALARMS, ///< Test configuration DD disabling BC pressure alarms + TEST_CONFIG_DD_ENABLE_DRY_BICARB, ///< Test configuration DD to use dry bicarb + TEST_CONFIG_DD_ENABLE_4WIRE_RINSE_PUMP, ///< Test configuration DD enable 4-wire rinse pump. + TEST_CONFIG_FP_SKIP_PRE_GEN_FLUSH, ///< Test configuration FP skip pre-gen flush + TEST_CONFIG_DD_ENABLE_DIENER_1000_PUMP, ///< Test configuration to use diener 1000 pump for D48 + TEST_CONFIG_DD_ENABLE_D79_PWM_CONTROL, ///< Test configuration to switch to PWM control for D79 + TEST_CONFIG_DD_ENABLE_SPENT_CHAMBER_H_FILL, ///< Test configuration DD enable spent chamber H fill + TEST_CONFIG_DD_DISABLE_CONDUCTIVITY_ALARMS, ///< Test configuration to disable DD conductivity alarms + TEST_CONFIG_FP_DISABLE_CONDUCTIVITY_ALARMS, ///< Test configuration to disable FP conductivity alarms + TEST_CONFIG_DD_ENABLE_DOSING_OPEN_LOOP_CONTROL, ///< Test configuration to switch to open loop control for concentrate dosing + TEST_CONFIG_DD_ENABLE_UF_TEMP_COMPENSATION, ///< Test configuration for enabling UF temperature compensation + NUM_OF_TEST_CONFIGS ///< Number of test configuration. } TEST_CONFIG_T; #endif