Index: TestSupport.h =================================================================== diff -u -r5e594b9d87744aa9a40a5abf31e5933db3d546ac -r8262535f06293d84f44325d0455b01a2423ebe5e --- TestSupport.h (.../TestSupport.h) (revision 5e594b9d87744aa9a40a5abf31e5933db3d546ac) +++ TestSupport.h (.../TestSupport.h) (revision 8262535f06293d84f44325d0455b01a2423ebe5e) @@ -8,7 +8,7 @@ * @file TestSupport.h * * @author (last) Sameer Kalliadan Poyil -* @date (last) 14-Jan-2026 +* @date (last) 10-Feb-2026 * * @author (original) Sean Nash * @date (original) 01-Aug-2024 @@ -50,22 +50,33 @@ /// DD test software configurations typedef enum test_Config_enums { - TEST_CONFIG_DISABLE_BC_PRESSURE_ALARMS = 0, ///< Test configuration disabling BC pressure alarms - TEST_CONFIG_FIRST = TEST_CONFIG_DISABLE_BC_PRESSURE_ALARMS, ///< Test configuration first configuration. - TEST_CONFIG_ENABLE_BETA_1_0_HW, ///< Test configuration enabling Beta 1.9 hardware - TEST_CONFIG_ENABLE_DRY_BICART_FILL, ///< Test configuration disabling Dry Bicart fill check - TEST_CONFIG_ENABLE_4WIRE_RINSE_PUMP, ///< Test configuration enable 4-wire rinse pump. - TEST_CONFIG_SKIP_FILTERS_FLUSH, ///< Test configuration to skip filter flush - NUM_OF_TEST_CONFIGS ///< Number of test configuration. + TEST_CONFIG_DD_FP_ENABLE_BETA_1_0_HW = 0, ///< Test configuration DD & FP enable Beta 1.0 hardware + TEST_CONFIG_FIRST = TEST_CONFIG_DD_FP_ENABLE_BETA_1_0_HW, ///< Test configuration first configuration. + TEST_CONFIG_DD_FP_ENABLE_BETA_2_0_HW, ///< Test configuration for DD & FP to enable Beta 2.0 hardware + TEST_CONFIG_DD_DISABLE_BC_PRESSURE_ALARMS, ///< Test configuration DD disabling BC pressure alarms + TEST_CONFIG_DD_ENABLE_DRY_BICARB, ///< Test configuration DD to use dry bicarb + TEST_CONFIG_DD_ENABLE_D79_PWM_CONTROL, ///< Test configuration to switch to PWM control for D79 + TEST_CONFIG_FP_SKIP_PRE_GEN_FLUSH, ///< Test configuration FP skip pre-gen flush + TEST_CONFIG_DD_ENABLE_DIENER_1000_PUMP, ///< Test configuration to use diener 1000 pump for D48 + TEST_CONFIG_DD_ENABLE_SPENT_CHAMBER_H_FILL, ///< Test configuration DD enable spent chamber H fill + TEST_CONFIG_DD_DISABLE_CONDUCTIVITY_ALARMS, ///< Test configuration to disable DD conductivity alarms + TEST_CONFIG_FP_DISABLE_CONDUCTIVITY_ALARMS, ///< Test configuration to disable FP conductivity alarms + TEST_CONFIG_DD_ENABLE_DOSING_OPEN_LOOP_CONTROL, ///< Test configuration to switch to open loop control for concentrate dosing + TEST_CONFIG_DD_ENABLE_UF_TEMP_COMPENSATION, ///< Test configuration for enabling UF temperature compensation + TEST_CONFIG_DD_DRY_BICART_TEST, ///< Test configuration DD to test initial fill , drain and initial chamber fill in pre-gen + TEST_CONFIG_DD_RUN_SOLO, ///< Test configuration to run DD alone without the need of other subsystems + NUM_OF_TEST_CONFIGS ///< Number of test configuration. } TEST_CONFIG_T; #endif #ifdef _TD_ /// TD test software configurations typedef enum test_Config { - TEST_CONFIG_FIRST = 0, ///< Test configuration first configuration. - NUM_OF_TEST_CONFIGS ///< Number of test configuration. + TEST_CONFIG_ENABLE_BETA_1_HW = 0, ///< Test configuration to enable Beta 1.0 hardware. + TEST_CONFIG_FIRST = TEST_CONFIG_ENABLE_BETA_1_HW, ///< Test configuration first configuration. + TEST_CONFIG_SKIP_BLOOD_PRIME, ///< Test configuration skip blood prime + NUM_OF_TEST_CONFIGS ///< Number of test configuration. } TEST_CONFIG_T; #endif