Index: TestSupport.h =================================================================== diff -u -r122a0258725e0870528d55aca94fed60e92e23c5 -r9db00086854fd2fbb0c60f81a69fe404dd0f8a1c --- TestSupport.h (.../TestSupport.h) (revision 122a0258725e0870528d55aca94fed60e92e23c5) +++ TestSupport.h (.../TestSupport.h) (revision 9db00086854fd2fbb0c60f81a69fe404dd0f8a1c) @@ -53,12 +53,16 @@ TEST_CONFIG_DD_FP_ENABLE_BETA_1_0_HW = 0, ///< Test configuration DD & FP enable Beta 1.0 hardware TEST_CONFIG_FIRST = TEST_CONFIG_DD_FP_ENABLE_BETA_1_0_HW, ///< Test configuration first configuration. TEST_CONFIG_DD_DISABLE_BC_PRESSURE_ALARMS, ///< Test configuration DD disabling BC pressure alarms - TEST_CONFIG_DD_ENABLE_DRY_BICART_FILL, ///< Test configuration DD enable dry bicart fill + TEST_CONFIG_DD_ENABLE_DRY_BICARB, ///< Test configuration DD to use dry bicarb TEST_CONFIG_DD_ENABLE_4WIRE_RINSE_PUMP, ///< Test configuration DD enable 4-wire rinse pump. TEST_CONFIG_FP_SKIP_PRE_GEN_FLUSH, ///< Test configuration FP skip pre-gen flush + TEST_CONFIG_DD_ENABLE_DIENER_1000_PUMP, ///< Test configuration to use diener 1000 pump for D48 + TEST_CONFIG_DD_ENABLE_D79_PWM_CONTROL, ///< Test configuration to switch to PWM control for D79 + TEST_CONFIG_DD_ENABLE_SPENT_CHAMBER_H_FILL, ///< Test configuration DD enable spent chamber H fill TEST_CONFIG_DD_DISABLE_CONDUCTIVITY_ALARMS, ///< Test configuration to disable DD conductivity alarms TEST_CONFIG_FP_DISABLE_CONDUCTIVITY_ALARMS, ///< Test configuration to disable FP conductivity alarms - TEST_CONFIG_DD_ENABLE_SPENT_CHAMBER_F_FILL, ///< Test configuration DD enable spent chamber fill + TEST_CONFIG_DD_ENABLE_DOSING_OPEN_LOOP_CONTROL, ///< Test configuration to switch to open loop control for concentrate dosing + TEST_CONFIG_DD_ENABLE_UF_TEMP_COMPENSATION, ///< Test configuration for enabling UF temperature compensation NUM_OF_TEST_CONFIGS ///< Number of test configuration. } TEST_CONFIG_T; #endif