What's the point of this line if you overwrite the lvl_sen value in the next 2 lines?
I think the second lvl_sen is not needed, the one without the offset.

LAST_DD_LEVL is in FW not in dialin.
In dialin, you use the Num_of_levels, so this one is correct here.
Example:
In this case Num_of_levels is 4 (D6,D63,D98,D46), if in the override adding 4 to the fp level sensor, which is 0, the payload will provide 4, which will be between the FIRST_FP_LEVL and LAST_FP_LEVL FW value as P25 index is 4.

Why increment the number when you didn't add a new sensor?

This should be LAST_DD_LEVL not NUM_OF_LEVELS if DD and FP levels are in same enum

LEVEL_OFFSET?

removed

Remove this extra line

This was made for the UI team, but it slowing down the init process and always throwing that error, that is not an error and not affecting the SW VV and SYS teams. So removing them to fasten the init process and to not have confusing messages

why are we passing this exception?

merged

renamed

renamed

Updated based on FW

Here is the latest list from fw

TEST_CONFIG_DD_FP_ENABLE_BETA_1_0_HW = 0, ///< Test configuration DD & FP enable Beta 1.0 hardware
TEST_CONFIG_FIRST = TEST_CONFIG_DD_FP_ENABLE_BETA_1_0_HW, ///< Test configuration first configuration.
TEST_CONFIG_DD_DISABLE_BC_PRESSURE_ALARMS, ///< Test configuration DD disabling BC pressure alarms
TEST_CONFIG_DD_ENABLE_DRY_BICARB, ///< Test configuration DD to use dry bicarb
TEST_CONFIG_DD_ENABLE_4WIRE_RINSE_PUMP, ///< Test configuration DD enable 4-wire rinse pump.
TEST_CONFIG_FP_SKIP_PRE_GEN_FLUSH, ///< Test configuration FP skip pre-gen flush
TEST_CONFIG_DD_ENABLE_DIENER_1000_PUMP, ///< Test configuration to use diener 1000 pump for D48
TEST_CONFIG_DD_ENABLE_D79_PWM_CONTROL, ///< Test configuration to switch to PWM control for D79
TEST_CONFIG_DD_ENABLE_SPENT_CHAMBER_H_FILL, ///< Test configuration DD enable spent chamber H fill
TEST_CONFIG_DD_DISABLE_CONDUCTIVITY_ALARMS, ///< Test configuration to disable DD conductivity alarms
TEST_CONFIG_FP_DISABLE_CONDUCTIVITY_ALARMS, ///< Test configuration to disable FP conductivity alarms
TEST_CONFIG_DD_ENABLE_DOSING_OPEN_LOOP_CONTROL, ///< Test configuration to switch to open loop control for concentrate dosing
TEST_CONFIG_DD_ENABLE_UF_TEMP_COMPENSATION, ///< Test configuration for enabling UF temperature compensation
NUM_OF_TEST_CONFIGS ///< Number of test configuration.

Please sync all of these with Firmware order of definitions.

TEST_CONFIG_DD_ENABLE_UF_TEMP_COMP. by default, temp compensation is disabled.

TEST_CONFIG_DD_ENABLE_DOSING_OPEN_LOOP_CONTROL

ENABLE_DRY_BICART_FILL vs ENABLE_LIQUID_BICARB => we can use only one of these. We can keep test config 2 ( may rename as ENABLE_DRY_BICARB) and 8 can be deleted.

updated

updated, thanks for the confirmation